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| No.8753872

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Information Name: | Supply of cerium oxide |
Published: | 2012-03-17 |
Validity: | 90 |
Specifications: | 99.99% |
Quantity: | 500.00 |
Price Description: | |
Detailed Product Description: | Cerium oxide / nano cerium oxide Cerium oxide, Cas No. [1306-38-3] the MDL: - MFCD00010933 The Beilstein EINECS: - 215-150-4 Formula CeO2 Molecular weight of 172.11 Alias ??dioxide, cerium oxide, cerium, cerium oxide Ceric oxide, Ceric oxide, ceria Molecular Structure Traits pale yellow or brown powder. Insoluble in water and alkali, soluble in hydrochloric acid and sulfuric acid. Density: 7.3 Melting point: 2600 ℃ Note: The above description is for reference only, does not mean that you receive the product with this description exactly matches the standard of products manufactured, see the quality standards. Quality standards 99.95% metals basis, <50 nm, the particle size (BET): Appearance Appearance nanopowder X-ray diffraction analysis of the X-Ray Diffraction Conforms to standard Purity Purity ≥ 99.95% Based on Trace Metals, Impurities of by ICP Particle size Particle size <50 nm (BET) surface area the spec. surface area 30 m2 / g (BET) density 7.13 g / mL, 25 ° C the bulk density 0.53 g/cm3, Trace metal analysis of the total metallic C. A ≤ 500ppm by by ICP Atomic emission 99.95% metals basis, <100 nm (BET) Appearance Appearance nanopowder X-ray diffraction analysis of the X-Ray Diffraction Conforms to standard Purity Purity ≥ 99.95% Based on the Trace Metals, Particle size Particle size <100 nm (BET) Trace metal analysis of the total metallic C. A ≤ 500ppm by by ICP Atomic emission 99.99% metals basis: Appearance of the Appearance Yellow to Tan, powder one X-ray diffraction analysis of the X-Ray Diffraction Conforms to standard Purity Purity ≥ 99.99% Based on Trace Metals, Impurities of by ICP ICP Assay Confirms Cerium component Loss of ignition loss on ignition is typically <1% Trace rare earth impurities in rare earth C. A ≤ 200ppm by ICP Atomic emission 20nm spherical, 99.5% Appearance Appearance nanopowder X-ray diffraction analysis of the X-Ray Diffraction Conforms to standard Trace metal analysis of the total metallic C. A ≤ 5000ppm by by ICP Atomic emission Purity Purity ≥ 99.5% Based on the Trace Metals, Particle size Particle size <20 nm (BET) Storage sealed save. Efficient catalyst of use, precision polishing, chemical additives, electronic ceramics, structural ceramics, UV collecting agent, battery materials. UN number Risk: R22- Safety: S24/25- Hazard: Xn |
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Copyright © GuangDong ICP No. 10089450, Ganzhou Kun Peng chemical Trading Co., Ltd. All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
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You are the 7441 visitor
Copyright © GuangDong ICP No. 10089450, Ganzhou Kun Peng chemical Trading Co., Ltd. All rights reserved.
Technical support: ShenZhen AllWays Technology Development Co., Ltd.
AllSources Network's Disclaimer: The legitimacy of the enterprise information does not undertake any guarantee responsibility